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Duncan M. (Hank) WalkerFord Motor Company Design Professor II and Department Head Department of Computer Science
and Engineering Office: H. R. Bright Building 305B Assistant: Elena Rodriguez, elena@cse.tamu.edu Ph.D., Computer Science, Carnegie Mellon University, 1986 |
STUDY ABROAD IN INDIA (Maymester 2013)
RECENT TEACHING
Spring 2010: CSCE/ECEN 680 Testing and Diagnosis of Digital Systems
Fall 2010: ENGR 111B Foundations of Engineering I – Introduction to Electrical and Computer Engineering (on elearning)
Spring 2011: CSCE 312 Computer Organization
Fall 2011: ENGR 111B Foundations of Engineering I – Introduction to Electrical and Computer Engineering (on elearning)
Spring 2012: CSCE 312 Computer Organization
Fall 2012: CSCE 481 Seminar
RESEARCH INTERESTS (EDA Lab)
- Integrated Circuit Test
- Defect-Based Test
- Delay Test
- IDDQ Test
- Fault Diagnosis
- Realistic Fault Modeling
- Parametric and Functional Yield Prediction
RECENT PROFESSIONAL EXPERIENCE
- Professor and Department Head, Department of Computer Science and Engineering, Texas A&M University, 2011-present.
- Professor and Graduate Advisor, Department of Computer Science and Engineering, Texas A&M University, 2006-2011.
- Associate Professor, Department of Computer Science, Texas A&M University; 1993-2006.
- Associate Head, Computing and Facilities Services, Department of Computer Science, Texas A&M University, 2000-2003.
- Academic Visitor, IBM Austin Research Laboratory, 1997.
RECENT PROFESSIONAL ACTIVITIES AND SERVICE
- Associate Editor, IEEE Transactions on Computer-Aided Design of Circuits and Systems, 2010-2011.
- Vice-General Chair, IEEE International Workshop on Defect Based Testing, 2006.
- Program Committee, IEEE International Conference on Computer Aided Design, 2003-2005.
- Program Committee, IEEE International Workshop on Defect Based Testing, 2004-present.
SOME (OLDER) REPRESENTATIVE PUBLICATIONS
- H. Balachandran, Y. J. Kwon, and D. M. H. Walker, "IDDQ Current Calibration with Process Variations", IEEE Int’l Workshop on IDDQ Testing, Oct. 1995.
- B. Choi and D. M. H. Walker, "Timing Analysis of Combinational Circuits Including Capacitive Coupling and Statistical Process Variation", IEEE VLSI Test Symposium, Montreal, Canada, April 2000. [PDF]
- J. Lee, D. M. H. Walker, L. Milor, Y. Peng, and G. Hill, "IC Performance Prediction for Test Cost Reduction", 1999 International Symposium on Semiconductor Manufacturing, Santa Clara, CA, November 1999. [PDF]
- C. Lee and D. M. H. Walker, "PROBE: A PPSFP Simulator for Resistive Bridging Faults", IEEE VLSI Test Symposium, Montreal, Canada, April 2000. [PDF]
- Y. Liao and D. M. H. Walker, "Optimal Voltage Testing for Physically-Based Faults", VLSI Test Symp., Apr. 1996. [PDF]
- Y. Liao and D. M. H. Walker, "Fault Coverage Analysis of Physically-Based Bridging Faults at Different Power Supply Voltages", IEEE Int’l Test Conf., Oct. 1996. [PDF]
- G. M. Luong, and D. M. H. Walker, "Test Generation for Global Delay Faults", IEEE Int’l Test Conf., Oct. 1996, pp. 433-442. [PDF]
- D. Nayak and D. M. H. Walker, "Simulation-Based Design Error Diagnosis and Correction in Combinational Circuits", 1999 VLSI Test Symposium, Dana Point, CA, April 1999, pp. 70-78. [PDF]
- V. Sar-Dessai and D. M. H. Walker, "Accurate Fault Modeling and Fault Simulation of Resistive Bridges", IEEE Int’l Symp. on Defect and Fault Tolerance in VLSI Systems", Nov. 1998. [PDF]
- V. Sar-Dessai, and D. M. H. Walker, "Resistive Bridge Fault Modeling, Simulation, and Test Generation", IEEE International Test Conference, September 1999. [PDF]
- T. A. Unni and D. M. H. Walker, "Model-Based IDDQ Pass/Fail Limit Setting", 1998 IEEE International Workshop on IDDQ Testing, San Jose, CA, November 1998.
- D. M. H. Walker, "Requirements for Practical IDDQ Testing of Deep Submicron Circuits", IEEE International Workshop on Current and Defect Based Testing, Montreal, Canada, April 2000.
- L. Zhao, D. M. H. Walker, and F. Lombardi, "Bridging Fault Detection in FPGA Interconnects Using IDDQ", 1998 Sixth ACM International Symposium on Field-Programmable Gate Arrays, Monterey, CA, March 1998, pp. 95-104.
- L. Zhao, D. M. H. Walker, and F. Lombardi, "Detection of Bridging Faults in Logic Resources of Configurable FPGAs Using IDDQ", IEEE International Test Conference, Washington, DC, October 1998.
- L. Zhao, D. M. H. Walker, and F. Lombardi, "IDDQ Testing of Bridging Faults in Logic Resources of Reprogrammable Field Programmable Gate Arrays", IEEE Trans. on Computers, October 1998, pp. 1136-1152.
- S. Balasubramaniam, A. K. Sarwar and D.M.H. Walker. "Yield Learning in Integrated Circuit Package Assembly", IEEE Trans. on Components, Packaging, and Manufacturing, Technology, Part C: Manufacturing, pp. 133-141, April 1997.
- Z. Stanojevic, H. Balachandran, D. M. H. Walker, F. Lakhani, S. Jandhyala, J. Saxena and K. M. Butler, "Computer-Aided Fault to Defect Mapping (CAFDM) for Defect Diagnosis", IEEE International Test Conference, Atlantic City, NJ, October 2000. [PDF]
- Gaitonde, D.D., and D.M.H. Walker, "Hierarchical Mapping of Spot Defects to Catastrophic Faults Design and Applications," IEEE Trans. on Semiconductor Manufacturing, pp. 167-177, May 1995.
- D. D. Gaitonde, J. Khare, D. M. H. Walker and W. Maly "Estimation of Reject Rates in Testing of Combinatorial Circuits", 1993 VLSI Test Symposium, Atlantic City, NJ, April 1993, pp. 319-325. [PDF]
REFEREED PUBLICATIONS 1999-2005
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